.csv
Raw Data
High-resolution AFM for surface imaging and nano-mechanical property mapping
Get your Dimension Icon data into Sourcetable in 3 simple steps
Export surface topography data from your Dimension Icon via NanoScope Analysis to CSV format
Import your AFM imaging data and surface measurements into Sourcetable for analysis
Perform automated surface roughness analysis and generate comprehensive nanoscale characterization reports
Complete support for Dimension Icon AFM data including surface topography and nano-mechanical property mapping for nanotechnology applications.
.csv
Raw Data
High-resolution AFM workflows for surface characterization with automated roughness calculations and 3D rendering.
High-resolution surface topography and morphology analysis
Automated surface roughness and step height measurements
Nano-mechanical property mapping with PeakForce QNM
The last spreadsheet you.ll ever need.
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