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Raw Data
Flexible multipurpose X-ray diffractometer for advanced materials research
Get your D8 ADVANCE data into Sourcetable in 3 simple steps
Export diffraction data from your D8 ADVANCE via DIFFRAC.SUITE to CSV format for multi-scan analysis
Import your advanced XRD data and texture analysis results into Sourcetable for analysis
Perform automated texture analysis and generate comprehensive materials characterization reports
Complete support for D8 ADVANCE XRD data including texture analysis and thin-film characterization for materials research applications.
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Raw Data
Advanced XRD workflows for materials research with texture analysis and automated multi-sample processing.
Comprehensive phase identification and quantification
Pole figure calculations and preferred orientation analysis
Residual stress and strain analysis in materials
The last spreadsheet you.ll ever need.
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