.csv
Raw Data
Floor-standing optical profilometer for high-throughput production metrology
Get your ContourX-1000 data into Sourcetable in 3 simple steps
Export production metrology data from your ContourX-1000 via Vision64 to CSV format for SPC analysis
Import your high-throughput measurement data and production statistics into Sourcetable
Perform automated production analysis and generate comprehensive manufacturing reports
Complete support for ContourX-1000 production data including wafer-scale measurements for semiconductor manufacturing applications.
.csv
Raw Data
.xlsx
Fully Formatted
High-throughput production metrology workflows with automated calibration and manufacturing execution system integration.
Full-wafer flatness and thickness mapping for semiconductor production
Surface uniformity quality control and process monitoring
High-volume roughness trend analysis and statistical process control
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