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Raw Data
Micro X-ray fluorescence analyzer (XRF microscope) for materials science (defect analysis)
Get your XGT-9000 data into Sourcetable in 3 simple steps
Export your XRF analysis results from your XGT-9000 via PC software export to CSV (spectral intensity data or quant results), image files (elemental maps).
Import your analytical data into Sourcetable for advanced statistical processing and visualization.
Perform automated data analysis with statistical validation, trend analysis, and generate comprehensive analytical reports.
Complete support for XGT-9000 XRF data including elemental mapping and quantitative analysis.
.csv
Raw Data
Advanced XRF workflows for materials science (defect analysis) with elemental mapping and automated multi-point analysis.
Non-destructive multi-element detection with quantitative analysis and spectral deconvolution
High-resolution 2D elemental mapping with statistical analysis and distribution plots
Automated RoHS/WEEE screening with pass/fail determination and regulatory reporting
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